An Aggressively Pruned CNN Model With Visual Attention for Near Real-Time Wood Defects Detection on Embedded Processors

Lim, Wei-Han ; Bonab, Mohammad Babrdel ; Chua, Kein Huat

IEEE access, 2023, Vol.11, p.36834-36848 [Periódico revisado por pares]

Piscataway: IEEE

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