An Aggressively Pruned CNN Model With Visual Attention for Near Real-Time Wood Defects Detection on Embedded Processors
Lim, Wei-Han ; Bonab, Mohammad Babrdel ; Chua, Kein Huat
IEEE access, 2023, Vol.11, p.36834-36848
[Periódico revisado por pares]
Piscataway: IEEE
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