A 0.003 mm ^ 10 b 240 MS/s 0.7 mW SAR ADC in 28 nm CMOS With Digital Error Correction and Correlated-Reversed Switching

Tsai, Jen-Huan ; Wang, Hui-Huan ; Yen, Yang-Chi ; Lai, Chang-Ming ; Chen, Yen-Ju ; Huang, Po-Chuin ; Hsieh, Ping-Hsuan ; Chen, Hsin ; Lee, Chao-Cheng

IEEE journal of solid-state circuits, 2015-06, Vol.50 (6), p.1382-1398 [Periódico revisado por pares]

New York: IEEE

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