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The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Girones, Vincent ; Boch, Jerome ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec ; Labau, Timothee ; Saigne, Frederic ; Alia, Ruben Garcia

IEEE transactions on nuclear science, 2023-01, Vol.70 (8), p.1-1 [Periódico revisado por pares]

New York: IEEE

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Título:
The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices
Autor: Girones, Vincent ; Boch, Jerome ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec ; Labau, Timothee ; Saigne, Frederic ; Alia, Ruben Garcia
Assuntos: BJT ; Cobalt ; Cobalt 60 ; Dose testing ; Elastic scattering ; Electrical & electronics engineering ; Electrical and Electronic Engineering ; Electronic components ; Electronic equipment ; Energy ; Engineering, computing & technology ; Generators ; Ingénierie électrique & électronique ; Ingénierie, informatique & technologie ; Irradiation ; Lead ; MOS ; Nuclear and High Energy Physics ; Nuclear Energy and Engineering ; Photoelectric effect ; Photoelectricity ; Photonics ; Photons ; Physical, chemical, mathematical & earth Sciences ; Physics ; Physique ; Physique, chimie, mathématiques & sciences de la terre ; Radiation effects ; Ray generators ; Scattering ; Testing ; Total Ionizing Dose ; X-ray ; X-rays
É parte de: IEEE transactions on nuclear science, 2023-01, Vol.70 (8), p.1-1
Notas: scopus-id:2-s2.0-85161040029
Descrição: A high energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low energy photons. Experimental results and simulations show that it is possible to filter the spectrum. From this result, the filtered X-ray generator is used to study the dose response of the electronic components and the obtained data are compared to the Cobalt 60 irradiation. The obtained results are analyzed and discussed. This work provides a first demonstration of the use of a filtered high-energy X-Ray generator for TID testing.
Editor: New York: IEEE
Idioma: Inglês

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The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Girones, Vincent ; Boch, Jerome ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec ; Labau, Timothee ; Saigne, Frederic ; Alia, Ruben Garcia

New York: IEEE

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