Carrier dynamics at surface and interface in hydrogenated amorphous silicon observed by the transient grating method

KOMURO, S ; AOYAGI, Y ; SEGAWA, Y ; NAMBA, S ; MASUYAMA, A ; OKAMOTO, H ; HAMAKAWA, Y

Applied physics letters, 1983-11, Vol.43 (10), p.968-970 [Periódico revisado por pares]

Melville, NY: American Institute of Physics

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