Size-dependent deformation mechanisms and strain-rate sensitivity in nanostructured Cu/X (X=Cr, Zr) multilayer films
Niu, J.J. ; Zhang, J.Y. ; Liu, G. ; Zhang, P. ; Lei, S.Y. ; Zhang, G.J. ; Sun, J.
Acta materialia, 2012-05, Vol.60 (9), p.3677-3689 [Periódico revisado por pares]Kidlington: Elsevier Ltd
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