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Scattering and Roughness Analysis of Indoor Materials at Frequencies from 750 GHz to 1.1 THz

Sheikh, Fawad ; Zantah, Yamen ; Ben Mabrouk, Ismail ; Alissa, Mai ; Barowski, Jan ; Rolfes, Ilona ; Kaiser, Thomas

IEEE transactions on antennas and propagation, 2021-11, Vol.69 (11), p.7820-7829 [Peer Reviewed Journal]

New York: IEEE

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Title:
Scattering and Roughness Analysis of Indoor Materials at Frequencies from 750 GHz to 1.1 THz
Author: Sheikh, Fawad ; Zantah, Yamen ; Ben Mabrouk, Ismail ; Alissa, Mai ; Barowski, Jan ; Rolfes, Ilona ; Kaiser, Thomas
Subjects: Absorptivity ; Indoor rough materials ; material characterization ; Material properties ; Measuring instruments ; Modelling ; Optical surface waves ; ray tracing ; Refractivity ; Rough surfaces ; Scattering ; Surface roughness ; Surface topography ; swissto12 material characterization kit (MCK) ; terahertz (THz) ; Terahertz frequencies ; vector network analyzer (VNA) ; Wave propagation ; Wireless communication ; Wireless communications ; Wireless sensor networks
Is Part Of: IEEE transactions on antennas and propagation, 2021-11, Vol.69 (11), p.7820-7829
Description: The problem of wave propagation and scattering at terahertz (THz) frequencies has become increasingly important, in particular for accurate modeling of future indoor wireless communication channels. The reflective properties of indoor materials with different surface roughness and dielectric constants are important to explore diffuse scattering for accurate channel modeling. First and foremost, a terahertz Swissto12 system is adopted to obtain the first ever transmission measurements for a wide choice of indoor material groups, such as wood, plastic , and brick at frequencies from 750 GHz to 1.1 THz using up-conversion (frequency-domain) method. Both the reflection (<inline-formula> <tex-math notation="LaTeX">S_{11} </tex-math></inline-formula>, <inline-formula> <tex-math notation="LaTeX">S_{22} </tex-math></inline-formula>) and transmission coefficients (<inline-formula> <tex-math notation="LaTeX">S_{12} </tex-math></inline-formula>, <inline-formula> <tex-math notation="LaTeX">S_{21} </tex-math></inline-formula>) are measured using this novel and noninvasive electromagnetic technique. The inversion method based on Kramers-Kronig (K-K) relations is then applied to convert the calibrated scatter data into intrinsic material properties (i.e., refractive index, permittivity, absorption coefficient). Then, the surface topography of rough material samples is acquired using surface measurement instruments. Further, the optically smooth <inline-formula> <tex-math notation="LaTeX">(\sigma _{h} /\lambda \ll 1) </tex-math></inline-formula> materials are assorted as most to least rough based on Rayleigh roughness factor. Lastly, the ray tracer considering the Rayleigh-Rice (R-R) scattering model is employed to obtain the maximum achievable reflected paths of the above-mentioned indoor material samples at 300 GHz followed by their experimental validation.
Publisher: New York: IEEE
Language: English

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Scattering and Roughness Analysis of Indoor Materials at Frequencies from 750 GHz to 1.1 THz

Sheikh, Fawad ; Zantah, Yamen ; Ben Mabrouk, Ismail ; Alissa, Mai ; Barowski, Jan ; Rolfes, Ilona ; Kaiser, Thomas

New York: IEEE

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