Extraction of thickness, linear and nonlinear optical parameters of Ge20+xSe80-x thin films at normal and slightly inclined light for optoelectronic devices

Alzaid, Meshal ; Qasem, Ammar ; Shaaban, E.R. ; Hadia, N.M.A.

Optical materials, 2020-12, Vol.110, Article 110539 [Periódico revisado por pares]

Elsevier B.V

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