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Analysis of the leakage drain current carriers in SOI MOSFETs operating at high-temperatures
Marcello Bellodi João Antonio Martino 1959-
São Paulo EPUSP 2002
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Title:
Analysis of the leakage drain current carriers in SOI MOSFETs operating at high-temperatures
Author:
Marcello Bellodi
João Antonio Martino 1959-
Subjects:
FILMES FINOS
Related Titles:
Series: Boletim Técnico da Escola Politécnica da USP. Departamento
de
Engenharia
de
Sistemas Eletrônicos, BT / PSI / 0209
Publisher:
São Paulo EPUSP
Creation Date:
2002
Format:
p. 1-10.
Language:
English
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