Three-dimensional [alpha] colony characterization and prior-[beta] grain reconstruction of a lamellar Ti-6Al-4V specimen using near-field high-energy X-ray diffraction microscopy

Wielewski, E ; Menasche, D B ; Callahan, P G ; Suter, R M

Journal of applied crystallography, 2016-06, Vol.48 (4), p.1165 [Periódico revisado por pares]

Oxford: Blackwell Publishing Ltd

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