Reliability silicon to systems considerations
Institute of Electrical and Electronics Engineers; International Electron Devices Meeting (1992)
Piscataway, N.J. IEEE Educational Activities Dept. c1992
Localização: EPELM - Esc. Politécnica-Bib Eng Elet., Mec. e Naval (VC 621.381 R279 v.4 )(Acessar)
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