Bayesian Model Selection for Spatial Clustering in 3D Surveys
Murtagh, Fionn D ; Donalek, C ; Longo, Giuseppe ; Tagliaferri, Roberto
Proceedings of SPIE, the International Society for Optical EngineeringProceedings of SPIE, the International Society for Optical Engineering, 2002, Vol.4847, p.391-401SPIE
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