Fracture Strain of SiC Nanowires and Direct Evidence of Electron-Beam Induced Amorphisation in the Strained Nanowires

Wang, Shiliang ; Wu, Yueqin ; Lin, Liangwu ; He, Yuehui ; Huang, Han

Small (Weinheim an der Bergstrasse, Germany), 2015-04, Vol.11 (14), p.1672-1676 [Periódico revisado por pares]

Germany: Blackwell Publishing Ltd

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