In situ photoelectron spectroscopic characterization of reactively sputtered, doped vanadium oxide thin films

Krammer, A. ; Gremaud, A. ; Bouvard, O. ; Sanjines, R. ; Schüler, A.

Surface and interface analysis, 2016-07, Vol.48 (7), p.440-444 [Periódico revisado por pares]

Bognor Regis: Blackwell Publishing Ltd

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