Fully analytical compact model for the I–V characteristics of large radius junctionless nanowire FETs
Regiane Ragi Murilo Araújo Romero
IEEE Transactions on Nanotechnology Piscataway, NJ, USA : IEEE, 2019 v. 18, n. 1, p. 762-769, 2019Piscataway, NJ, USA 2019
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