Architecture of Cobweb-Based Redundant TSV for Clustered Faults

Ni, Tianming ; Liu, Dongsheng ; Xu, Qi ; Huang, Zhengfeng ; Liang, Huaguo ; Yan, Aibin

IEEE transactions on very large scale integration (VLSI) systems, 2020-07, Vol.28 (7), p.1736-1739 [Periódico revisado por pares]

New York: IEEE

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