Study on Measurement Error Reduction Using the Internal Interference Light Reduction Structure of a Time-of-Flight Sensor

Lee, Byung-Chul ; Choi, Byeong-Chan ; Bang, Hyeon-Song ; Koh, Yong Nam ; Han, Kwan-Young

IEEE sensors journal, 2022-07, Vol.22 (13), p.12967-12975 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível