XCT analysis of the influence of melt strategies on defect population in Ti–6Al–4V components manufactured by Selective Electron Beam Melting

Tammas-Williams, S. ; Zhao, H. ; Léonard, F. ; Derguti, F. ; Todd, I. ; Prangnell, P.B.

Materials characterization, 2015-04, Vol.102, p.47-61 [Periódico revisado por pares]

United States: Elsevier Inc

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