Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test
Nattino, Giovanni ; Pennell, Michael L. ; Lemeshow, Stanley
Biometrics, 2020-06, Vol.76 (2), p.549-560 [Periódico revisado por pares]United States: Blackwell Publishing Ltd
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