Surface vs. Bulk Phonons in Off-axis EELS
Yang, Hongbin ; Yan, Xingxu ; Aoki, Toshihiro ; Pan, Xiaoqing
Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2872-2874
[Periódico revisado por pares]
New York, USA: Cambridge University Press
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