skip to main content
Idioma:

Modeling and Simulation of Mono-Layer Coating

Uzi, A ; Ostrovski, Y ; Levy, A

Drying technology, 2015-11, Vol.33 (15-16), p.1798-1807 [Periódico revisado por pares]

Philadelphia: Taylor & Francis

Texto completo disponível

Citações Citado por
  • Título:
    Modeling and Simulation of Mono-Layer Coating
  • Autor: Uzi, A ; Ostrovski, Y ; Levy, A
  • Assuntos: Agglomeration ; Capillary forces ; Coating ; coatings ; Computer simulation ; deformation ; DEM simulation ; Drying ; Fluid dynamics ; Liquid levels ; Liquids ; Mathematical models ; Nanoparticle ; Nanoparticles ; Nanostructure ; Particle size ; Self-assembly ; Simulation ; simulation models
  • É parte de: Drying technology, 2015-11, Vol.33 (15-16), p.1798-1807
  • Notas: http://dx.doi.org/10.1080/07373937.2015.1026981
    ObjectType-Article-1
    SourceType-Scholarly Journals-1
    ObjectType-Feature-2
    content type line 23
  • Descrição: Coating simulations of nano-suspended particles are implemented using the DEM-CFD method. A new model of capillary interactions, accounting for the microscale interface deformation implicitly but allowing a rather fast calculation time, is implemented. The drying of a nano-suspension liquid layer is modeled and implemented to the DEM code, allowing transient examination of mono-layer aggregation. The effect of particle size on the coating process is investigated. The main contrast in particle size was received in terms of the transition periods to the finite structure. It was found that the non-dimensional liquid height is a correlative parameter between the cases. Aggregation appears to start at approximately the same non-dimensional liquid height. Furthermore, a firm final structure was obtained at a similar liquid level, way before the drying is complete, indicating that the liquid level has a significant control on the assembly until this point.
  • Editor: Philadelphia: Taylor & Francis
  • Idioma: Inglês
Voltar para lista de resultados

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.