The Influence of 0–0.1 wt.% Ni on the Microstructure and Fluidity Length of Sn-0.7Cu-xNi

Ventura, Tina ; Gourlay, Christopher M. ; Nogita, Kazuhiro ; Nishimura, Tetsuro ; Rappaz, Michel ; Dahle, Arne K.

Journal of electronic materials, 2008-01, Vol.37 (1), p.32-39 [Periódico revisado por pares]

Boston: Springer US

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