Direct Observations of Retention Failure in Ferroelectric Memories

Gao, Peng ; Nelson, Christopher T. ; Jokisaari, Jacob R. ; Zhang, Yi ; Baek, Seung-Hyub ; Bark, Chung Wung ; Wang, Enge ; Liu, Yuanming ; Li, Jiangyu ; Eom, Chang-Beom ; Pan, Xiaoqing

Advanced materials (Weinheim), 2012-02, Vol.24 (8), p.1106-1110 [Periódico revisado por pares]

Weinheim: WILEY-VCH Verlag

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