Tackling Data Scarcity with Transfer Learning: A Case Study of Thickness Characterization from Optical Spectra of Perovskite Thin Films
Siyu Isaac Parker Tian ; Ren, Zekun ; Selvaraj Venkataraj ; Cheng, Yuanhang ; Bash, Daniil ; Oviedo, Felipe ; Senthilnath, J ; Chellappan, Vijila ; Yee-Fun Lim ; Aberle, Armin G ; MacLeod, Benjamin P ; Parlane, Fraser G L ; Berlinguette, Curtis P ; Li, Qianxiao ; Buonassisi, Tonio ; Liu, Zhe
arXiv.org, 2022-12Ithaca: Cornell University Library, arXiv.org
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