The influence of the back gate voltage on the leakage drain current in accumulation mode SOI pMOSFETs at high temperatures

Marcello Bellodi João Antonio Martino 1959-; International Conference on Microelectronics and Packaging (13. 1998 Curitiba)

SBMicro'ICMP 98 : Proceedings Curitiba : SBMicro/LACTRO/LAC, 1998

Curitiba SBMicro/LACTRO/LAC 1998

Item não circula. Consulte sua biblioteca.(Acessar)