Improved Measurement of the π→eν Branching Ratio

• Autor: Aguilar-Arevalo, A ; Aoki, M ; Blecher, M ; Britton, D I ; Bryman, D A ; Vom Bruch, D ; Chen, S ; Comfort, J ; Ding, M ; Doria, L ; Cuen-Rochin, S ; Gumplinger, P ; Hussein, A ; Igarashi, Y ; Ito, S ; Kettell, S H ; Kurchaninov, L ; Littenberg, L S ; Malbrunot, C ; Mischke, R E ; Numao, T ; Protopopescu, D ; Sher, A ; Sullivan, T ; Vavilov, D ; Yamada, K
• Assuntos: branching ; measurement ; PHYSICS OF ELEMENTARY PARTICLES AND FIELDS ; ratio
• É parte de: Physical review letters, 2015-08, Vol.115 (7), p.071801-071801, Article 071801
• Notas: ObjectType-Article-1
  SourceType-Scholarly Journals-1
  ObjectType-Feature-2
  content type line 23
  BNL-108222-2015-JA
  USDOE Office of Science (SC), High Energy Physics (HEP)
  SC00112704
  
• Descrição: A new measurement of the branching ratio R_{e/μ}=Γ(π^{+}→e^{+}ν+π^{+}→e^{+}νγ)/Γ(π^{+}→μ^{+}ν+π^{+}→μ^{+}νγ) resulted in R_{e/μ}^{exp}=[1.2344±0.0023(stat)±0.0019(syst)]×10^{-4}. This is in agreement with the standard model prediction and improves the test of electron-muon universality to the level of 0.1%.
  
• Editor: United States: American Physical Society (APS)
  
• Idioma: Inglês