Comparison of refractive indices measured by m-lines and ellipsometry application to polymer blend and ceramic thin films for gas sensors
Thomas Wood Judikaël Le Rouzo; François Flory; Paul Coudray; Valmor Roberto Mastelaro; Pedro Pelissari; Sérgio Carlos Zílio; Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors (6. 2012 San Diego)
Proceedings of SPIE Bellingham : International Society for Optical Engineering - SPIE v. 8466, p. 84660T-1-84660T-10, 2012Bellingham International Society for Optical Engineering - SPIE 2012
Localização: IFSC - Inst. Física de São Carlos (PROD019988 ) e outros locais(Acessar)
- 0
- 1
- 2
- 3
- 4
- 5
- 6
- 7
- 8
- 9
- 10
- 11
- 12
- 13
- 14
- 15
- 16
- 17
- 18
- 19
- 20
- 21
- 22
- 23
- 24
- 25
- 26
- 27
- 28
- 29
- 30
- 31
- 32
- 33
- 34
- 35
- 36
- 37
- 38
- 39
prod020006
prod019963
browse_callnumber
display.do?gathStatTab=true&dscnt=0&callNumberBrowseField=browse_callnumber&tabRealType=browseshelf&mode=Basic&vid=USP&rfnGrp=1&rfnGrp=2&tab=usp_fisico&dstmp=1721444625091&rfnGrpCounter=1&fctV=Proceedings+of+SPIE&fctV=eng&callNumber=prod019988&fctN=facet_jtitle&fctN=facet_lang&vl(freeText0)=Optics&ct=display&fn=search&indx=10&recIdxs=0&elementId=0
Anterior
Página Inicial
RSS
Feed
Políticas
Fale Conosco-
Realização:
Logos de Redes Sociais: 