Comparison of refractive indices measured by m-lines and ellipsometry application to polymer blend and ceramic thin films for gas sensors
Thomas Wood Judikaël Le Rouzo; François Flory; Paul Coudray; Valmor Roberto Mastelaro; Pedro Pelissari; Sérgio Carlos Zílio; Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors (6. 2012 San Diego)
Proceedings of SPIE Bellingham : International Society for Optical Engineering - SPIE v. 8466, p. 84660T-1-84660T-10, 2012Bellingham International Society for Optical Engineering - SPIE 2012
Disponible en IFSC - Inst. Física de São Carlos (PROD019988 ) y otras localizaciones(Obténgalo)