Saturation measurements of electrically detected magnetic resonance in hydrogenated amorphous silicon based thin film transistors
Genshiro Kawachi Carlos Frederico de Oliveira Graeff; Martin Stephan Brandt; Martin Stutzmann
Japanese Journal of Applied Physics Tokyo v. 36, pt. 1, n. 1A, p. 121-125, jan. 1997Tokyo 1997
Localização: FFCLRP - Fac. Fil. Ciên. Let. de R. Preto (pcd 927492 Estantes Deslizantes )(Acessar)