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The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features

Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K ; Font, Josep ; Thomson, Neil H Gruverman, Alexei

PloS one, 2011-08, Vol.6 (8), p.e23821 [Periódico revisado por pares]

United States: Public Library of Science

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Título:
The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features
Autor: Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K ; Font, Josep ; Thomson, Neil H
Gruverman, Alexei
Assuntos: Antibodies ; Applied physics ; Astronomy ; Atomic force microscopes ; Atomic force microscopy ; Deformation ; Deformation mechanisms ; Dehydration ; Deoxyribonucleic acid ; DNA ; DNA - chemistry ; Engineering ; Enginyeria electrònica ; Física ; Immunoglobulin G ; Immunoglobulin G - chemistry ; Immunoglobulins ; Indentation ; Materials Science ; Mathematical models ; Mechanical properties ; Medical research ; Microscopes ; Microscopy ; Microscopy, Atomic Force - methods ; Microscòpia de força atòmica ; Molecular biology ; Nanostructures - chemistry ; Nanotechnology ; Nanotecnologia ; Physics ; Predictions ; Pressure distribution ; Salt deposits ; Salts ; Spatial discrimination ; Spatial resolution ; Topography ; Àrees temàtiques de la UPC
É parte de: PloS one, 2011-08, Vol.6 (8), p.e23821
Notas: Conceived and designed the experiments: SS VB HKC JF NHT. Performed the experiments: SS. Analyzed the data: SS VB HKC JF NHT. Contributed reagents/materials/analysis tools: NT. Wrote the paper: SS HKC NHT. Provided the DNA Samples: DB WB.
Descrição: Accurate mechanical characterization by the atomic force microscope at the highest spatial resolution requires that topography is deconvoluted from indentation. The measured height of nanoscale features in the atomic force microscope (AFM) is almost always smaller than the true value, which is often explained away as sample deformation, the formation of salt deposits and/or dehydration. We show that the real height of nano-objects cannot be obtained directly: a result arising as a consequence of the local probe-sample geometry. We have modeled the tip-surface-sample interaction as the sum of the interaction between the tip and the surface and the tip and the sample. We find that the dynamics of the AFM cannot differentiate between differences in force resulting from 1) the chemical and/or mechanical characteristics of the surface or 2) a step in topography due to the size of the sample; once the size of a feature becomes smaller than the effective area of interaction between the AFM tip and sample, the measured height is compromised. This general result is a major contributor to loss of height and can amount to up to ∼90% for nanoscale features. In particular, these very large values in height loss may occur even when there is no sample deformation, and, more generally, height loss does not correlate with sample deformation. DNA and IgG antibodies have been used as model samples where experimental height measurements are shown to closely match the predicted phenomena. Being able to measure the true height of single nanoscale features is paramount in many nanotechnology applications since phenomena and properties in the nanoscale critically depend on dimensions. Our approach allows accurate predictions for the true height of nanoscale objects and will lead to reliable mechanical characterization at the highest spatial resolution.
Editor: United States: Public Library of Science
Idioma: Inglês

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The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features

Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K ; Font, Josep ; Thomson, Neil H Gruverman, Alexei

United States: Public Library of Science

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