Paramagnetic defect centers in BESOI and SIMOX buried oxides
Warren, W.L. ; Shaneyfelt, M.R. ; Schwank, J.R. ; Fleetwood, D.M. ; Winokur, P.S. ; Devine, R.A.B. ; Maszara, W.P. ; McKitterick, J.B.
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1993-12, Vol.40 (6), p.1755-1764 [Periódico revisado por pares]New York, NY: IEEE
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