Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering

Bouchet-Fabre, B. ; Marino, E. ; Lazar, G. ; Zellama, K. ; Clin, M. ; Ballutaud, D. ; Abel, F. ; Godet, C.

Thin solid films, 2005-06, Vol.482 (1), p.167-171 [Periódico revisado por pares]

Lausanne: Elsevier B.V

Texto completo disponível