Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits
Song, Ruiqiang ; Shao, Jinjin ; Chi, Yaqing ; Liang, Bin ; Chen, Jianjun ; Wu, Zhenyu
Electronics (Basel), 2023-12, Vol.12 (24), p.4978
[Periódico revisado por pares]
Basel: MDPI AG
Texto completo disponível