Optimized Dropkey-Based Grad-CAM: Toward Accurate Image Feature Localization

Liu, Yiwei ; Tang, Luping ; Liao, Chen ; Zhang, Chun ; Guo, Yingqing ; Xia, Yixuan ; Zhang, Yangyang ; Yao, Sisi

Sensors (Basel, Switzerland), 2023-10, Vol.23 (20), p.8351 [Periódico revisado por pares]

Basel: MDPI AG

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