Exploring best-matched embedding model and classifier for charging-pile fault diagnosis

Wang, Wen ; Wang, Jianhua ; Peng, Xiaofeng ; Yang, Ye ; Xiao, Chun ; Yang, Shuai ; Wang, Mingcai ; Wang, Lingfei ; Li, Lin ; Chang, Xiaolin

Cybersecurity, 2023-12, Vol.6 (1), p.7-13, Article 7 [Periódico revisado por pares]

Singapore: Springer Nature Singapore

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