A comparative study on titanium impurities in silicon, diamond and silicon carbide
L. V. C. Assali (Lucy Vitória Credidio) Wanda Valle Marcondes Machado; João Francisco Justo Filho 1966-; International Conference on Defects in Semiconductors (22. 2003 Aarhus)
Book of Abstracts Amsterdam : Elsevier Science, 2003Amsterdam Elsevier Science 2003
Item não circula. Consulte sua biblioteca.(Acessar)