Mechanism of Néel Order Switching in Antiferromagnetic Thin Films Revealed by Magnetotransport and Direct Imaging

Baldrati, L. ; Gomonay, O. ; Ross, A. ; Filianina, M. ; Lebrun, R. ; Ramos, R. ; Leveille, C. ; Fuhrmann, F. ; Forrest, T. R. ; Maccherozzi, F. ; Valencia, S. ; Kronast, F. ; Saitoh, E. ; Sinova, J. ; Kläui, M.

Physical review letters, 2019-10, Vol.123 (17), p.1-177201, Article 177201 [Periódico revisado por pares]

College Park: American Physical Society

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