Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods

Capello, L. ; Metzger, T. H. ; Holý, V. ; Servidori, M. ; Malachias, A.

Journal of applied crystallography, 2006-08, Vol.39 (4), p.571-581 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: Blackwell Publishing Ltd

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