Long-term fluctuations associated with different standards

Valdes, J. ; Porfiri, M.E. ; Lobbe, E.E. ; Kornblit, F. ; Passarino de Marques, M.N. ; Leiblich, J.A.

IEEE transactions on instrumentation and measurement, 1993-04, Vol.42 (2), p.269-272 [Periódico revisado por pares]

New York, NY: IEEE

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