Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy

Verma, Hina ; Le Guen, Karine ; Delaunay, Renaud ; Ismail, Iyas ; Ilakovac, Vita ; Rueff, Jean Pascal ; Zheng, Yunlin Jacques ; Jonnard, Philippe

Surface and interface analysis, 2021-12, Vol.53 (12), p.1043-1047 [Periódico revisado por pares]

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