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Recent Progress on Synchrotron-Based In-Situ Soft X-ray Spectroscopy for Energy Materials

Liu, Xiaosong ; Yang, Wanli ; Liu, Zhi

Advanced materials (Weinheim), 2014-12, Vol.26 (46), p.7710-7729 [Periódico revisado por pares]

Germany: Blackwell Publishing Ltd

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  • Título:
    Recent Progress on Synchrotron-Based In-Situ Soft X-ray Spectroscopy for Energy Materials
  • Autor: Liu, Xiaosong ; Yang, Wanli ; Liu, Zhi
  • Assuntos: ambient pressure photoelectron spectroscopy ; Devices ; energy material ; in situ ; Instrumentation ; Light sources ; Mathematical models ; operando ; Photons ; soft X-ray spectroscopy ; Soft x-rays ; Spectroscopy ; synchrotron radiation ; Synchrotrons ; X-ray absorption spectroscopy ; X-ray emission spectroscopy
  • É parte de: Advanced materials (Weinheim), 2014-12, Vol.26 (46), p.7710-7729
  • Notas: National Natural Science Foundation of China - No. 11227902
    ArticleID:ADMA201304676
    istex:736D74880673328F6C58AD6406147A4257BFB8F0
    ark:/67375/WNG-87W7MRMC-9
    Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy - No. DE-AC02-05CH11231
    ObjectType-Article-1
    SourceType-Scholarly Journals-1
    ObjectType-Feature-2
    content type line 23
  • Descrição: Soft X‐ray spectroscopy (SXS) techniques such as photoelectron spectroscopy, soft X‐ray absorption spectroscopy and X‐ray emission spectroscopy are efficient and direct tools to probe electronic structures of materials. Traditionally, these surface sensitive soft X‐ray techniques that detect electrons or photons require high vacuum to operate. Many recent in situ instrument developments of these techniques have overcome this vacuum barrier. One can now study many materials and model devices under near ambient, semi‐realistic, and operando conditions. Further developments of integrating the realistic sample environments with efficient and high resolution detection methods, particularly at the high brightness synchrotron light sources, are making SXS an important tool for the energy research community. In this progress report, we briefly describe the basic concept of several SXS techniques and discuss recent development of SXS instruments. We then present several recent studies, mostly in situ SXS experiments, on energy materials and devices. Using these studies, we would like to highlight that the integration of SXS and in situ environments can provide in‐depth insight of material's functionality and help researchers in new energy material developments. The remaining challenges and critical research directions are discussed at the end. Recent instrumentation developments have advanced soft X‐ray spectroscopic tools for studying real‐world samples. Both photon‐in‐electron‐out and photon‐in‐photon‐out spectroscopy can be perfor­med under semi‐realistic, and operando conditions through high‐efficiency and high‐resolution detection systems at high‐brightness synchrotron light sources. This Progress Report focuses on many recent advancements on in situ soft X‐ray spectroscopic tools and their applications in developing energy materials.
  • Editor: Germany: Blackwell Publishing Ltd
  • Idioma: Inglês
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