Memory Window and Endurance Improvement of Hf0.5Zr0.5O2-Based FeFETs with ZrO2 Seed Layers Characterized by Fast Voltage Pulse Measurements

Xiao, Wenwu ; Liu, Chen ; Peng, Yue ; Zheng, Shuaizhi ; Feng, Qian ; Zhang, Chunfu ; Zhang, Jincheng ; Hao, Yue ; Liao, Min ; Zhou, Yichun

Nanoscale research letters, 2019-07, Vol.14 (1), p.1-7, Article 254 [Periódico revisado por pares]

New York: Springer US

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