Impact of the Measurement Errors on Synchrophasor-Based WAMS Applications

Zhao, Jiecheng ; Tan, Jin ; Wu, Ling ; Zhan, Lingwei ; Yao, Wenxuan ; Liu, Yilu

IEEE access, 2019-01, Vol.7 [Periódico revisado por pares]

United States: Institute of Electrical and Electronics Engineers

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