Fully analytical compact model for the Q–V and C–V characteristics of cylindrical junctionless nanowire FETs
Adelcio Marques de Souza Daniel Ricardo Celino; Regiane Ragi; Murilo Araujo Romero
Microelectronics Journal v. 119, article 105324, p. 1-8, 2022London, UK 2022
Localização: EESC - Esc. Engenharia de São Carlos (PROD-027000 )(Acessar)
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display.do?gathStatTab=true&dscnt=0&vl(1UIStartWith0)=exact&callNumberBrowseField=browse_callnumber&vid=USP&tabRealType=browseshelf&mode=Advanced&rfnGrp=1&rfnGrp=2&tab=usp_producao&vl(4708870UI0)=creator&dstmp=1724233956403&rfnGrpCounter=1&scp.scps=scope%3A%28USP_PRODUCAO%29&fctV=Ragi%2C+R&fctV=Semicondutores&vl(4708880UI3)=all_items&callNumber=prod-027000&fctN=facet_creator&fctN=facet_topic&vl(freeText0)=Romero%2C%20M&ct=display&fn=search&indx=5&recIdxs=0&elementId=0