Noise effects on performance of low power design schemes in deep submicron regime [CMOS digital ICs]

Abbas, M. ; Ikeda, M. ; Asada, K.

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.87-95

Los Alamitos CA: IEEE

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