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Surface resistance and morphology of YBCO films as a function of thickness

Stork, F.J.B. ; Beall, K.A. ; Roshko, A. ; DeGroot, D.C. ; Rudman, D.A. ; Ono, R.H. ; Krupka, J.

IEEE transactions on applied superconductivity, 1997-06, Vol.7 (2), p.1921-1924 [Periódico revisado por pares]

New York, NY: IEEE

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Título:
Surface resistance and morphology of YBCO films as a function of thickness
Autor: Stork, F.J.B. ; Beall, K.A. ; Roshko, A. ; DeGroot, D.C. ; Rudman, D.A. ; Ono, R.H. ; Krupka, J.
Assuntos: Applied sciences ; Circuit properties ; Critical current density ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Laser transitions ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Scanning electron microscopy ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Superconducting devices ; Superconducting films ; Superconducting transition temperature ; Surface emitting lasers ; Surface morphology ; Surface resistance ; Temperature dependence ; Yttrium barium copper oxide
É parte de: IEEE transactions on applied superconductivity, 1997-06, Vol.7 (2), p.1921-1924
Notas: ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
Descrição: We have examined the thickness dependence of the growth morphology and surface resistance R/sub s/ of laser ablated YBa/sub 2/Cu/sub 3/O/sub 7-x/ films with transition temperatures over 89 K and critical current densities greater than 10/sup 6/ A/cm/sup 2/ at 76 K. The thickness was varied from 50 to 1600 nm while all other deposition conditions were maintained constant. The microstructure has been characterized by scanning electron microscopy and scanning tunneling microscopy continuously decreased with film thickness as a power law with an exponent of -0.5. The surface resistance was measured at 76 K with a dielectric rod resonator. For films less than 300 nm thick, the fields penetrated the superconducting films, causing a rapid increase in the apparent R/sub s/ with decreasing film thickness. Films thicker than 800 nm showed microcracks and the R/sub s/ increased sharply, and no resonance was observed above 1000 nm.
Editor: New York, NY: IEEE
Idioma: Inglês

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Surface resistance and morphology of YBCO films as a function of thickness

Stork, F.J.B. ; Beall, K.A. ; Roshko, A. ; DeGroot, D.C. ; Rudman, D.A. ; Ono, R.H. ; Krupka, J.

New York, NY: IEEE

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