Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry

McKay, M. A. ; Li, J. ; Lin, J. Y. ; Jiang, H. X.

Journal of applied physics, 2020-02, Vol.127 (5) [Periódico revisado por pares]

Melville: American Institute of Physics

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