The effect of elastic photoelectron scattering on depth-profiling by angular resolved X-ray photoelectron spectroscopy

• Autor: Baschenko, O.A. ; Nesmeev, A.E.
• Assuntos: Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Electron and ion emission by liquids and solids; impact phenomena ; Exact sciences and technology ; Photoemission and photoelectron spectra ; Physics
• É parte de: Journal of electron spectroscopy and related phenomena, 1991-09, Vol.57 (1), p.33-46
• Descrição: By means of Monte-Carlo calculation the effect of elastic photoelectron scattering on angular resolved X-ray photoelectron spectroscopy (ARXPS) data has been established. A method which accounts for this effect while restoring concentration profiles from ARXPS data has been proposed. A number of model examples showing that elastic scattering leads to about a 20% decrease of the effective photoelectron mean free paths in a solid sample have been considered.
  
• Editor: Amsterdam: Elsevier B.V
  
• Idioma: Inglês