The first observation of shot noise characteristics in 10-nm scale MOSFETs
Jeon, J. ; Lee, J. ; Kim, J. ; Park, C.H. ; Lee, H. ; Oh, H. ; Kang, H.-K. ; Park, B.-G. ; Shin, H.
2009 Symposium on VLSI Technology, 2009, p.48-49
IEEE
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