Design Paradigm for Robust Spin-Torque Transfer Magnetic RAM (STT MRAM) From Circuit/Architecture Perspective

Jing Li ; Ndai, Patrick ; Goel, Ashish ; Salahuddin, Sayeef ; Roy, Kaushik

IEEE transactions on very large scale integration (VLSI) systems, 2010-12, Vol.18 (12), p.1710-1723 [Periódico revisado por pares]

New York, NY: IEEE

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