Scanning electron microscopy, x-ray microanalysis and analytical electron microscopy a laboratory workbook. Charles E. Lyman, Dale E. Newbury, Joseph I. Goldstein, David B. Williams, Alton D. Romig, Jr., John T. Armstron, Patrick Echlin, Charles E. Fiori, David C. Joy, Eric Lifshin, Klaus-Ruediger Peters Plenum Press, New York (1992) ISBN: 0-306-435918; $32.50

Cleaver, C. Gordon

Scanning, 1993, Vol.15 (1), p.51-51 [Periódico revisado por pares]

New Jersey: Wiley Periodicals, Inc

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